中圖分類號：TN306 文獻標志碼：A DOI: 10.16157/j.issn.0258-7998.246015
中文引用格式： 江徽，唐震，王倩倩，等. 器件級帶電器件模型靜電放電測試標準分析及應(yīng)用[J]. 電子技術(shù)應(yīng)用，2025，51(4)：35-39.
英文引用格式： Jiang Hui，Tang Zhen，Wang Qianqian，et al. Analysis and application of electrostatic discharge testing standards for device level charged device models[J]. Application of Electronic Technique，2025，51(4)：35-39.

Analysis and application of electrostatic discharge testing standards for device level charged device models

Abstract： This article summarizes, analyzes, and interprets the main testing standards for electrostatic discharge of device level charged device models (CDM) both domestically and internationally. The differences and correlations between various standards were sorted out, and the application scope and technical points of each standard were clarified. The impact factors and control methods that affect the testing results of device level charged device models (CDM) were deeply studied. Relevant technical skills were proposed to ensure the consistency and accuracy of test results in the standard application process, providing guidance for the selection, testing, and engineering application of device level charged device model testing standards.

Key words : charged device model；device level；test standard